Analytical Centrifugation

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Atomic force microscopy (AFM) probes the surface of a sample with a sharp tip, a couple of microns long and less than 100Å in diameter. Forces between the tip and the sample surface cause the cantilever to bend, or deflect, producing a map of surface topography with atomic resolution.

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A cleanroom is an environment that has a low level of environmental pollutants such as dust, airborne microbes, aerosol particles and chemical vapors. It has a controlled level of contamination that is specified by the number of particles per cubic meter at a specified particle size. Cleanrooms are classified according to the number and size of particles permitted per volume of air.

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An optical complex spectrum analyzer uses interferometric techniques (heterodyne) to measuring both the spectral intensity and spectral phase of the input light with very high spectral resolution (~20MHz). This allows the detailed analysis of high-speed signals which are used in optical communications systems.

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High power pulsed diode laser for illuminatig objects at high repetition rates for imaging experiments

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Used to determine the size distribution profile of small particles in solution. When light hits small particles the light scatters in all directions so long as the particles are small compared to the wavelength. If the light source is a laser one observes a time-dependent fluctuation in the scattering intensity. This scattered light undergoes interference by the surrounding particles, within this intensity fluctuation, information is contained about the time scale of movement of the scatterers.

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A electrophysiologic workbench is useful to measure membrane voltage changes of nerve cells, so-called action potentials, to find out whether the cell responds to an extracellular applied electrical/chemical/optical or other stimulation.

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Fast real-time oscilloscopes with gigasample/second capability provide a means to capture multiple high speed waveforms, revealing details of the experimental dynamics.

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Femtosecond laser systems are designed to generate pulsewidths in the range of <1ps to <10fs. Femtosecond laser are used for materials processing, plasma generation, and investigations of fast photodynamic processes in solids, solutions and gases. Systems can include multiple harmonic wavelength outputs and can also be combined with OPO and OPAs to generate pulses for a range of pump and probe spectroscopy techniques.

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Description to follow

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A Focused Ion Beam (FIB) system uses a Ga+ ion beam to raster over the surface of a sample in a similar way as the electron beam in a scanning electron microscope. The generated secondary electrons (or ions) are collected to form an image of the surface of the sample. The ion beam allows the milling of small holes in the sample at well localized sites, so that cross-sectional images of the structure can be obtained or that modifications in the structures can be made.

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Fourier transform infrared (FTIR) spectroscopy is a measurement technique for collecting infrared spectra. Instead of recording the amount of energy absorbed when the frequency of the infra-red light is varied (monochromator), the IR light is guided through an interferometer. After passing through the sample, the measured signal is the interferogram.

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The FREAG gives complete recovery of spectral and temporal information on ultrafast laser pulses in real time, and is similar to, but far more sensitive than, Frequency Resolved Optical Gating (FROG). It works by linear transmission through a modulated gate, contrasting with the non-linear crystal required for second-harmonic generation autocorrelators. The result is the same, accurate recovery of real and imaginary parts of the electric field but without requiring high intensity input.

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High Content Analysis

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AMPS is a high-performance computing cluster that provides computing power to solve complex simulations of crystals, fluids and structures.

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High speed video cameras are typically capable of capturing image streams at greater than 1000 fps and up to 1 million fps.

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The probe station allows for detailed examination and testing of devices while they are still on the wafer or in bars, using a powerful microscope and CCD camera for imaging, and probes to temporarily contact individual devices on the wafer.

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Microplate Reader are designed to detect biological, chemical or physical events of samples in microtiter plates. Sample reactions can be (assayed) in 6-1536 well format microtiter plates. A high-intensity lamp passes light to the microtiter well and the light emitted by the reaction happening in the microplate well is quantified by a detector. detection modes for microplate assays are absorbance, fluorescence intensity, luminescence, time-resolved fluorescence, and fluorescence polarization.

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An optical sampling oscilloscope uses the nonlinear interaction (via Four Wave Mixing in this case) of a source of ultra short optical pulses with the signal under test to give a measurement of optical intensity with very high temporal resolution (~1ps). This enables the development of new high speed photonic devices and systems and the study of ultra fast phenomena.

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Protein Expression

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Pulsed laser deposition is a thin film deposition (specifically a physical vapor deposition, PVD) technique where a high power pulsed laser beam is focused inside a vacuum chamber to strike a target of the desired composition. Material is then vaporized from the target and deposited as a thin film on a substrate, such as a silicon wafer facing the target. This allow us to produced devices with controlled stoichiometric and epitaxial growth.

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In a pump-probe experiment, a pump pulse excites a sample and induces changes that are measured using a subsequent probe pulse. By varying the time between pump and probe pulses, one can retrieve the recovery time scales of the sample. Pump-probe techniques provide direct, time domain, measurement of gain and refractive index nonlinearities in optical waveguides with sub-picosecond resolution.

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Raman spectroscopy is a spectroscopic technique used to study vibrational, rotational and low-frequency modes in a system. It relies on inelastic scattering, Raman scattering, of monochromatic light usually from a laser in the visible, near infrared, or near ultraviolet range. The laser light interacts with phonons or other excitations in the system resulting in the energy of the laser photons being shifted up or down. The shift in energy gives information about the phonon modes in the system.

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The scanning electron microscope (SEM) is a type of electron microscope that images the sample surface by scanning it with a high-energy beam of electrons in a raster scan pattern. The electrons interact with the atoms that make up the sample producing signals that contain information about the sample's surface topography, composition and other properties such as electrical conductivity.

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A picosecond laser generates ultrashort pulses which are generally defined as <50 ps (x10-12 s). In a Thin Disk system the laser amplified is based on a Thin crystal Disk rather than the more common cylinder. This geometry provides enhanced beam quality due to better thermal management and hence minimised thermal lensing effects. This type of laser is typically utilised for laser ablative machining.

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Sputtering is a technique used to deposit thin films of a material onto a surface (a.k.a. "substrate"). A gaseous plasma is created and the ions from this plasma are accelerated into a source material (a.k.a. "target") which is eroded by the ions and ejected in the form of neutral particles - either individual atoms, clusters of atoms or molecules. As these particles are ejected they travel in a straight line unless they come into contact with something - other particles or a nearby surface.

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The TRPL setup can explore the ultrafast dynamics of optical devices at speeds much greater than conventional spectrum analysers, on the order of picoseconds. The key to this is the streak camera, which provides a temporal and spectral profile of the light pulse, by converting the pulse into a stream of electrons, which is then deflected by a time-varying electric field. Thus the temporal structure of the pulse is converted into a spatial distribution, or ‘streak’, pattern on the detector.

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Transmission electron microscopes (TEM) utilize very thin (0.5 µm or less) samples illuminated by an electron beam. Images are recorded by detecting the electrons that pass though the sample to a system of electromagnetic lenses which focus and enlarge the image on a fluorescent screen, photographic film or digital camera. Magnifications beyond 1,000,000X are attainable with a transmission electron microscope.

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High-resolution X-ray diffraction is used to characterize the thickness, crystallographic structure, and strain in thin epitaxial films/crystals. It is based on observing the diffraction pattern of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength or energy. It allows researchers to study and characterize the structure of newly fabricated materials and devices.

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