‘High resolution field emission scanning electron microscopy with energy dispersive X-ray (EDX) analysis ’
The Nova NanoSEM 630 is a Schottky Field Emission SEM that combines high- and low-voltage ultra high resolution capabilities with the world’s only low vacuum high resolution imaging solution. It brings unprecedented versatile capabilities to researchers and developers in the nanotechnology laboratory working with a variety of nano-materials and/or devices
Ultra-high resolution characterization at high and low voltage in high vacuum: 1.6 nm @ 1 kV
Beam deceleration mode with sub-100 V and high surface sensitivity imaging
Superb low and very low kV backscattered electron imaging for compositional characterisation in high and low vacuum
Novel high stability Schotky field emission gun enabling beam current of up to 100 nA for superb EDX analysis
The ultimate characterisation tool for charging or contaminating nano-materials or devices.
Tyndall National Institute, UCC