Overview

‘High resolution field emission scanning electron microscopy with energy dispersive X-ray (EDX) analysis ’
 

The Nova NanoSEM 630 is a Schottky Field Emission SEM that combines high- and low-voltage ultra high resolution capabilities with the world’s only low vacuum high resolution imaging solution.  It brings unprecedented versatile capabilities to researchers and developers in the nanotechnology laboratory working with a variety of nano-materials and/or devices

• Ultra-high resolution characterization at high and low voltage in high vacuum: 1.6 nm @ 1 kV
• Beam deceleration mode with sub-100 V and high surface sensitivity imaging
• Superb low and very low kV backscattered electron imaging for compositional characterisation in high and low vacuum
• Novel high stability Schotky field emission gun enabling beam current of up to 100 nA for superb EDX analysis
• The ultimate characterisation tool for charging or contaminating nano-materials or devices.

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Location:

Tyndall National Institute, UCC